Description

• Keysight Agilent HP E5262A for sale
• Perform high-speed, dc parametric measurements
• Fixed-configuration dual SMU instrument
• Basic and simple IV measurement via Desktop EasyEXPERT
• Measurement capabilities
  • /- 100 Volt and /- 200 milliamp output capability (MPSMU)
  • 2.2 Amp ground unit

The fast measurement speed of the Keysight Agilent HP E5262A makes it an ideal choice for high-speed production test in situations requiring only one or two SMUs. Based on Keysight Agilent HP 4070 Series system technology, the Keysight Agilent HP E5262A lowers your cost-of-test with a high-speed parametric test solution for semiconductor, RFIC, and optical component testing. Two MPSMU modules and a ground unit are included in the Keysight Agilent HP E5262A, providing just enough test capability for many component-testing needs. The Keysight Agilent HP E5262A provides superior measurement throughput, several times faster than earlier products such as the Keysight Agilent HP 4142B. A number of innovative design elements help to improve the efficiency of complex testing, such as expanded program memory to accelerate the measurement process, and 16 digital I/O lines for sophisticated triggering requirements. The Keysight Agilent HP E5262A performs DC measurements of current and voltage and achieves measurement speeds that are 2-3 times faster than that of the Keysight Agilent HP 4142B. Easily migrate from your current Keysight Agilent HP 4142B test environment to the Keysight Agilent HP E5262A because programs developed for the 4142B can run on the Keysight Agilent HP E5262A with only minor modification. Program memory has been greatly enhanced, with storage capacity for up to 40,000 command lines, which accelerates the measurement process. A fast and flexible advanced triggering scheme, based upon 16 digital I/O lines, in addition to the BNC trigger-in & trigger-out connectors, is ideal for sophisticated triggering requirements. Also, trigger signals are routed through hardware rather than firmware, resulting in the fastest instrument response possible. To enable parallel testing, each SMU is equipped with its own analog-to-digital converter (ADC) therefore no bottlenecks. Engineers can perform and report spot measurements easily via a simple front-panel interface, without programming. In addition, you can use the same user interface to view other items of interest, such as error messages when debugging the instrument performance under automated control.